Versions Compared

Key

  • This line was added.
  • This line was removed.
  • Formatting was changed.

...

Type: Schematic Change

Reason: Enable Enabled higher DCDC input voltage usage.

...

Reason: Fixed wrong resistor value.

Impact: None.

#5 Changed inductor (L9) from XGL4030-301MEC to XGL5030-351MEC.

Type: Schematic Change

Reason: Increased current capability.

Impact: None. Increased inductance and current capability and improved resistance.

#6 Increased voltage from 1.35 V to 1.45 V via voltage divider resistors (R30) and changed voltage rail name accordingly from PL_GT_1V35 to PL_GT_1V45.

Type: Schematic Change

Reason: Improve voltage rail behaviour.

Impact: None.

...

#7 Increased voltage from 1.05 V to 1.15 V via voltage divider resistors (R33 and R35) and changed voltage rail name accordingly from PL_GT_1V05 to PL_GT_1V15.

Type: Schematic Change

Reason: Improve voltage rail behaviour.

Impact: None.

...

#8 Added option to use remote senses for DCDCs U29 via resistor R128 (Default: not fitted).

Type: Schematic Change

Reason: Remote sense option.

Impact: None.

...

#9 Added option to use remote sense for DCDCs U30 via resistor R126 (Default: not fitted).

Type: Schematic Change

Reason: Remote sense option.

Impact: None.

...

#10 Added option to use remote senses for DCDCs U31 via resistor R129 (Default: not fitted).

Type: Schematic Change

Reason: Remote sense option.

Impact: None.

...

#11 Improved voltage rail VTT layout and added decoupling capacitor (C202...C205).

Type: Schematic Change

Reason: VTT layout and decoupling improvement.

Impact: Improved VTT voltage rail reliabililty.

...

#12 Added diode D2 between U41 pin 3 net MR and voltage rail 3.3VIN.

Type: Schematic Change

Reason: Protect manual reset pin.

Impact: None.

...

#13 Enabled DDR4 test usage via connecting DDR4-TEN signals together for DDR4 memory (U2, U3, U9, U12) and pulling them low via 499 Ohm resistor R127. Added testpoint TP3 for signal DDR4-TEN.

Type: Schematic Change

Reason: Enable DDR4 test improvement.

Impact: None.

...

#14 Added pull-up resistor for "HOLD"-function (R130) and "WP"-function (R131) for flash (U7).

Type: Schematic Change

Reason: Improved SPI interface usage with different flashs.

Impact: None.

...

#15 Added pull-up resistor for "HOLD"-function (R132) and "WP"-function (R133) for flash (U17).

Type: Schematic Change

Reason: Improved SPI interface usage with different flashs.

Impact: None.

...

#16 Added additional decoupling capacitors C196...C201, C206...C208, C210...C216.

Type: Schematic Change

Reason: Improve decoupling.

Impact: None.

...

#17 Changed 100 nF capacitor (C37, C95, C96, C130, C131) from 6.3 V, X5R, 0201 to 50 V, X7R, 0402.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#18 Changed 10 nF capacitor (C112) from 16 V, 0402 to 10 V, 0201.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#19 Changed capacitor (C76, C77, C134, C195) from 1 µF, 16 V, to 2.2 µF 10 V.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#20 Changed capacitor (C129, C140, C141, C142, C143, C144, C145, C146, C147, C148, C153) from 10 µF, 16 V, to 22 µF 10 V.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#21 Changed 22 µF capacitor (C70, C73, C74, C75) from 0805 to 0603.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#22 Changed 22 µF capacitor (C78, C80, C81, C82, C83, C84, C85, C86, C87, C110, C152, C154, C178) from 6.3 V to 10 V.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#23 Changed 100 Ohm resistor (R7, R10) from 0201, 0.05 W to 0402, 0.063 W.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#24 Changed resistor (R77) from 12 kOhm to 10 kOhm.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#25 Changed resistor (R41, R58) from 2 kOhm to 2.49 kOhm.

Type: Schematic Change

Reason: BOM Optimization.

Impact: None.

...

#26 Added testpoints (TP4, TP10, TP11, TP13, TP14, TP19, TP21, TP22, TP33...TP72).

Type: Schematic Change

Reason: Improve voltage measuring possibilities.

Impact: None.

...

#27 Added UKCA logo.

Type: PCB Change

Reason: Required for export to UK.

Impact: None.

...

#28 Updated components from library.

Type: Schematic Change

Reason: Use latest component data.

Impact: None.

...

#29 Changed signal trace lengths.

Type: PCB Change

Reason: Result of changes above.

Impact: Changed trace length have to be taken into account in existing designs. The trace length for new revision will be available in TE081x series pinout generator. Please check if change in trace length still matches your requirements. Adaption of carrier may be necessary.

...

#30 Updated documentation.

Type: Documentation Update

...